In-Sight
®
1700 Series Wafer Reader Section 3: Configuring a Wafer ID Application
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3.4.15 Tune
The Tune button accesses the automated tuning process used to optimize Config
settings (see Figure 3-8).
During tuning, an exhaustive read test is performed on the mark using many
combinations of Light Mode, Light Power, Size, and Color settings (and the current
definitions for the Mark, Checksum, Accept, Field String/Definition, Character Spacing
and Region settings). After each iteration, the string and score results for the last read
are displayed. The best string and score result achieved so far are shown, along with
counts of the total number of reads attempted and the number of successful reads.
NOTE The image display is not updated during tuning.
Figure 3-8: Tuning a Character String
When tuning is completed, the combination of settings that correctly read the mark with
highest score is retained, and can be applied to the Config or discarded.
