In-Sight
®
1700 Series Wafer Reader Section 5: Running the Job:
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5.1.2 Read Log
A record of the most recent read results. This log returns the string, score, and pass/fail
status of each Config that is read or retried.
NOTE If the reader is offline, a continuous log is displayed. If the reader is online, only the last read
results are displayed.
5.1.3 Statistics Window
A statistical record of the read results.
NOTE Any changes to a Config’s settings will reset the statistics for that Config, but do not change the
overall statistics.
Config
The index of each enabled Config.
Attempts
The number of times that the Config has been used during reading.
Passed
The number of times that the Config read successfully.
Failed
The number of times that the Config failed to read.
Response Avg
The average raw response score of all attempted reads for the Config.
Overall
The cumulative statistics from the results of all reads.
NOTE The Overall statistics are calculated independently of the statistics for the individual Configs.
5.1.4 Read
The Read button acquires an image and reads the wafer mark. The String and Score
results are reported to the right. The Read button is grayed out when the Online
checkbox in enabled.
