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No. 99MBC071A
Measurement
PROG
BUSY
RUN
+NG
GO
-NG
Press the
C.RUN
key.
is displayed and continuous-run
measurement starts.
Provided that edges 1 through 82 are detected within
the measuring region and that the measurements of the
edges 2 and 3 are within the detection range, the system
recognizes the workpiece presence and starts actual
measurements after the elapse of invalidation period.
PROG
BUSY
RUN
+NG
GO
-NG
In approximately 1.62 second after the invalidation
period the measured data will be displayed.
If the tolerancing judgment result is GO, the mean
value is displayed.
If the judgment result is ±NG, the number of the pin
pitch where ±NG was detected for the first time is
also displayed.
If the next objective IC enters the measuring region, it is automatically detected and
measurement will be repeated.
TIP 1. Measurement time of automatic measurement
{ (Number of objective leads of measurement) x (Measurement interval) + (calcu-
lation time: 20 ms)} = (40 x 40 + 20) ms = 1.62 second.
2. If GO/NG judgment is ±NG
The ±NG measurement data, which is detected first, is displayed and the judg-
ment result is outputted. Subsequent measurement is stopped.
3. For the automatic workpiece detection on IC or connector measurement, the part
to be measured (such as PIT, DIA, GAP) of the smallest edge number (falls on
pin No.1) is used for detection, if the diameter detection method is specified.
With the position-detection method measurement starts when the edge of the
smallest eage number is detected.
IMPORTANT About automatic measurement of a moving workpiece
For automatic measurement on a multi-pin IC, etc., this instrument will sequentially
perform measurement from the smallest edge number in the scanning range. For
this reason, if any edge moves outside the scanning range during measurement, the
edge number may change, resulting in incorrect measurement. Therefore, allow a
sufficient measuring time including the invalidation period for automatic measure-
ment.
If possible, take measures so that the workpiece stops within the measuring region.