Agilent Technologies 8935 series e6380a Cell Phone Accessories User Manual


 
214 Chapter 6
C:\Spk\Ref\RefGuideRevE\Anlgscrn.fm
Analog Measurements - Screens and Control Fields
Control Fields for Analog Measurements
Scope To
This field selects the signal source for the oscilloscope. This allows you
to bypass certain sections of the AF analyzer’s circuitry when viewing
and measuring a signal. It also allows you to select measurement paths
that include additional gain stages, improving the oscilloscope’s
resolution when measuring low-level signals.
Input looks at the unfiltered signal directly from the input.
Filters looks at the signal after filtering through Filter 1 and
Filter 2.
De-Emp looks at the signal after filtering through Filter 1 and
Filter 2, and after 750 µs de-emphasis (if the De-emphasis field is
set to 750 us.)
Notch looks at the signal after filtering through Filter 1 and Filter 2,
after de-emphasis (if used), and after the notch filter.
Screens on which this field is displayed
AF ANALYZER
Sensitivity (RF analyzer)
RF analyzer sensitivity adds about 6 dB of sensitivity for the ANT IN
port when High is selected and the Input Atten field is set to 0 dB.
Operating Considerations
Selecting High sensitivity may cause spectrum analyzer measurements
to be uncalibrated when the ANT IN port is used (a message appears
when this occurs).
High-level AM measurements may be distorted when high sensitivity is
used with the ANT IN port.
Screens on which this field is displayed
RF ANALYZER